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News 10.04.2026
New publication: Weak localization as a probe of spin-orbit-induced spin-split bands in bilayer graphene proximity coupled to WSe2

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News 14.10.2021

International standard for measuring the flatness of graphene has been published

Jointly with the Standardization Commission of the Graphene Flagship our institute (big thanks to Christoph Neumann and Jens Sonntag) have pushed through a new IEC standard for assessing the strain uniformity of single-layer graphene using Raman spectroscopy.

For more details see: IEC TS 62607-6-6 “Nanomanufacturing – Key control characteristics – Part 6-6: Graphene – Strain uniformity: Raman spectroscopy” https://webstore.iec.ch/publication/34162.

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